defect-classification

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

A taxonomy of defects with a benchmarking script that validates which of them can be spot by which static analyzers

Diameter measurement, cable defect detection and classification.

A user-friendly web application for detecting defects on painted surfaces using live webcam input and image uploads.

An impactful project SEM -i-CON which does Defect Classification for Semiconductor Wafer/Die Images from Specialized Electron microscope (SEM) by developing an edge AI

This repository contains implementation of ResNet for surface defect classification, with detailed analysis of results.

This project is for defect classification on multi-light source

ResNet-18 wafer defect classifier trained on WM-811K — focal loss, CBAM attention, TTA, and Grad-CAM++ explainability. Macro-F1 0.916 on the 9-class labeled subset.

🚀 Official code for IEEE ECCE 2025 paper: "Advancing Semiconductor Fabrication: A CNN-Based Wafer Defect Detection with XAI Insights". ResNet50 classifier (94.08% accuracy) with Explainable AI (Grad-CAM) on the WM-811K benchmark.

Mango Classification Competition by AICUP 2020

An end-to-end, production-ready MLOps ecosystem designed for automated Metal surface inspection.